Redefine Semiconductor Test Engineering

Complete range of semiconductor test services to optimise coverage, cost and quality.

Turn to us for all your semiconductor testing requirements. From simple to complex devices, our services encompass test program development, platform conversions, device characterisation, reliability assessments, and high-volume wafer and package testing. We do it all with deep and proven expertise.


IC Test Design Solutions for Next-Gen Devices

Complete test engineering solutions for simple to complex (SOCs, FPGAs) devices.

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Pattern Conversion

Conversion from VCD, eVCD, STIL to tester patterns

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Tester & Equipment Selection

Based on product & test requirements

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Design Of Test Methodologies


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Hardware Design & Fabrication

Loadboards, probe cards, sockets & pins

Test Development

Test Program Development

New product enabling & stabilisation

Sample Validation

Engineering Sample Validation

Sample size from tens to thousands

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High Volume & High Mix Testing

Wafer sort, package test, visual inspection, bake, pack, drop-ship

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Manufacturing Improvements

Tester & multi-site conversion, test time reduction

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Your Smart Factory Automation Solution

Provides the specialised tools you need to make your manufacturing process simpler, smarter, predictable and replicable. ​

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Big Data Analytics

Real-time data analytics for decision making

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Smart Equipment

Know your equipment performance and limitations

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Universal Tester UI

Single uniform user interface to tester

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Recipe Management

Never use a wrong recipe on any machine ever again

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Process Control

Automatically halt any out-of-control events or anomalies

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Stock Inventory

Never run short or misplace items again

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Knowledge Management

Always available, updated and compliant knowledge

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Advance Scheduler

Never miss or be late for maintenance or calibration


Enhancing expertise through hands-on application

Theories & concepts taught by industry experts

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A Deeper Peek Into Product and Test Engineering

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I/O Testing, DFT & Design Verification Fundamentals

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Data Analysis for High Volume Manufacturing

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BIST, SBFT, SRAM/Cache & Kitchen Sink Algorithms

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Industrial RF Theorems in Testing

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HVM Improvements and Optimisations

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Automatic Test Equipment Based Debugging


Hands-on with Multi-million dollar Tester Equipment