Redefine Semiconductor Test Engineering
Complete range of semiconductor test services to optimise coverage, cost and quality.
Turn to us for all your semiconductor testing requirements. From simple to complex devices, our services encompass test program development, platform conversions, device characterisation, reliability assessments, and high-volume wafer and package testing. We do it all with deep and proven expertise.
IC Test Design Solutions for Next-Gen Devices
Complete test engineering solutions for simple to complex (SOCs, FPGAs) devices.
Pattern Conversion
Conversion from VCD, eVCD, STIL to tester patterns
Tester & Equipment Selection
Based on product & test requirements
Design Of Test Methodologies
JTAG/TAP, SCAN, BIST, Cache/DAT, IO DFT, SBFT, RF, etc.
Hardware Design & Fabrication
Loadboards, probe cards, sockets & pins
Test Program Development
New product enabling & stabilisation
Engineering Sample Validation
Sample size from tens to thousands
High Volume & High Mix Testing
Wafer sort, package test, visual inspection, bake, pack, drop-ship
Manufacturing Improvements
Tester & multi-site conversion, test time reduction
Your Smart Factory Automation Solution
Provides the specialised tools you need to make your manufacturing process simpler, smarter, predictable and replicable.
Big Data Analytics
Real-time data analytics for decision making
Smart Equipment
Know your equipment performance and limitations
Universal Tester UI
Single uniform user interface to tester
Recipe Management
Never use a wrong recipe on any machine ever again
Process Control
Automatically halt any out-of-control events or anomalies
Stock Inventory
Never run short or misplace items again
Knowledge Management
Always available, updated and compliant knowledge
Advance Scheduler
Never miss or be late for maintenance or calibration
Education
Enhancing expertise through hands-on application
Theories & concepts taught by industry experts
A Deeper Peek Into Product and Test Engineering
I/O Testing, DFT & Design Verification Fundamentals
Data Analysis for High Volume Manufacturing
BIST, SBFT, SRAM/Cache & Kitchen Sink Algorithms
Industrial RF Theorems in Testing
HVM Improvements and Optimisations
Automatic Test Equipment Based Debugging
Hands-on with Multi-million dollar Tester Equipment